G06T 7/0081 (20130101)
A system and method for image-processing that will facilitate automatically analyzing and estimating atomic force microscopy (AFM) images and magnetic force microscopy (MFM) images of fabricated nanomagnetic arrays to identify the magnetization states of the nanomagnets in the array. The system and method will automatically estimate the magnetization states of nanomagnetics disks into one of a plurality of energy minimum magnetization state configurations and provide an annotated image of the results of the estimation.
Panchumarthy, Ravi; Karunaratne, Dinuka K.; Sarkar, Sudeep; and Bhanja, Sanjukta, "System and method for estimating the magnetization states of a nanomagnet array" (2016). USF Patents. 840.
University of South Florida