The present invention provides for a digital holographic microscope using a holographic interferometer and incorporating a TIR sample mount and microscopic imaging optics. The microscope uses phase shifting from frustrated internal reflection within a prism to measure nanometric distances. The invention also provides for a numerical reconstruction algorithm of an inclined surface of the object/prism.
Kim, Myung K., "Total internal reflection holographic microscope" (2010). USF Patents. 528.
University of South Florida