Document Type
Patent
Publication Date
October 2010
Patent Number
7812959
Abstract
The present invention provides for a digital holographic microscope using a holographic interferometer and incorporating a TIR sample mount and microscopic imaging optics. The microscope uses phase shifting from frustrated internal reflection within a prism to measure nanometric distances. The invention also provides for a numerical reconstruction algorithm of an inclined surface of the object/prism.
Application Number
12/053,978
Recommended Citation
Kim, Myung K., "Total internal reflection holographic microscope" (2010). USF Patents. 528.
https://digitalcommons.usf.edu/usf_patents/528
Assignees
University of South Florida
Filing Date
03/24/2008
Primary/U.S. Class
356/458
COinS
