Document Type
Article
Publication Date
March 2020
Patent Number
10587345
CPC
H04B 10/556, H04B 10/70
Abstract
An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
Application Number
16/396618
Recommended Citation
Shi, Zhimin, "Measurement apparatus of vectorial optical fields" (2020). USF Patents. 1133.
https://digitalcommons.usf.edu/usf_patents/1133
Assignees
University of South Florida
Filing Date
04/26/2019
