Document Type

Patent

Publication Date

3-15-2016

Patent Number

9286687

CPC

G06T 7/0081 (20130101)

Abstract

A system and method for image-processing that will facilitate automatically analyzing and estimating atomic force microscopy (AFM) images and magnetic force microscopy (MFM) images of fabricated nanomagnetic arrays to identify the magnetization states of the nanomagnets in the array. The system and method will automatically estimate the magnetization states of nanomagnetics disks into one of a plurality of energy minimum magnetization state configurations and provide an annotated image of the results of the estimation.

Application Number

14/467,686

Assignees

University of South Florida

Filing Date

2014-08-25

Share

COinS