Graduation Year

2004

Document Type

Thesis

Degree

M.S.; M.S.E.S.

Degree Granting Department

Physics; Engineering Science

Major Professor

Pritish Mukherjee

Keywords

confocal microscopy, PLD, pinhole, film, optics, profile

Abstract

This thesis presents a study of the intensified charge-coupled device (ICCD) imaging of pulsed laser ablated plumes. Two-dimensional imaging of laser ablated plumes is a very important diagnostic for PLD. ICCD array photography is a useful tool for imaging PLD. The images obtained using the standard technique are characterized and compared with ICCD images of an altered plume, ICCD images intentionally violating standard imaging procedures, and film thickness. The depth resolving properties of a pinhole was investigated with the intention of applying it to PLD plume imaging. This results in a more thorough understanding of the depth resolving property of a pinhole. The investigation leads to a theoretical improvement for the resolution in confocal microscopy.

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