Graduation Year
2005
Document Type
Thesis
Degree
M.S.E.E.
Degree Granting Department
Electrical Engineering
Major Professor
Rudy Schlaf, Ph.D.
Committee Member
John T. Wolan, Ph.D.
Committee Member
Francis Moussy, Ph.D.
Keywords
XPS, UPS, Interface, Amino acid, Electronic structure
Abstract
Using photoemission spectroscopy (PES) the interface between the amino acid Lcysteine and a Au substrate was characterized to determine its electronic and chemical structure. L-cysteine was deposited on a Au substrate in several experiments via dipping into solution or via evaporation. The depositions were performed in several steps. Between deposition steps x-ray photoemission spectroscopy (XPS) and ultraviolet photoemission spectroscopy (UPS) measurements were taken. XPS was used to characterize the chemical interaction at the interface while UPS was used to determine the orbital line-up at the interface and the highest molecular orbital (HOMO) structure of L-cysteine. The results indicate the formation of an interface state at approximately 1.5 eV above the L-cysteine HOMO.
Scholar Commons Citation
Gargagliano, Roy, "Characterization of L-cysteine Thin Films Via Photoemission Spectroscopy" (2005). USF Tampa Graduate Theses and Dissertations.
https://digitalcommons.usf.edu/etd/2891
